Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

Somoza, Andres M.; Palacios-Lidon, Elisa

Publication:
Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

dc.contributor.author	Somoza, Andres M.
dc.contributor.author	Palacios-Lidon, Elisa
dc.contributor.department	Física
dc.date.accessioned	2025-01-20T18:08:54Z
dc.date.available	2025-01-20T18:08:54Z
dc.date.issued	2020-02-27
dc.description	©2020. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/ This document is the accepted version of a Published Work that appeared in final form in Physical Review B. To access the final edited and published work see https://doi.org/10.1103/PhysRevB.101.075432
dc.description.abstract	The study of thin-film materials is a subject of growing interest. Some of these materials are insulating due to the presence of disorder, which also produces localization of charges. Kelvin probe force microscopy (KPFM) is a unique tool to characterize these materials, but a full quantitative interpretation of the results is still lacking. To address this problem, we propose a simple and fast procedure based on the image charge method that represents an advance in this direction since it is not limited to any film thickness or the nature of the underlying substrate. Even more, it can be combined with fast Fourier transform algorithms to generate theoretical images from known charge distributions or to obtain charge distributions from the Kelvin voltage images. Within this framework, we analyze the problem of the lateral resolution of the technique, providing a criterion to estimate it. Finally, we address the problem of systems with hopping conductivity where multiple localized charges coexist. We demonstrate that even in these complex systems, the KPFM gives valuable information, allowing us to distinguish between noninteracting and interacting electronic systems. Furthermore, it is possible to calculate the charge density in the noninteracting case.	es
dc.format	application/pdf	es
dc.format.extent	8	es
dc.identifier.citation	Physical Review B 101, 075432
dc.identifier.doi	https://doi.org/10.1103/PhysRevB.101.075432
dc.identifier.issn	Print: 2469-9950
dc.identifier.issn	Electronic: 2469-9969
dc.identifier.uri	http://hdl.handle.net/10201/148865
dc.language	eng	es
dc.publisher	American Physical Society	es
dc.relation	This work was supported by Spanish MINECO Grants No. FIS2015-67844-R and No. ENE2016-79282-C5-4-R and by Fundación Séneca Grants No. 19907/GERM/15 and No. 20860/PI/18.	es
dc.relation.publisherversion	https://journals.aps.org/prb/abstract/10.1103/PhysRevB.101.075432	es
dc.rights	info:eu-repo/semantics/openAccess	es
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 Internacional	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.subject	Charge Density of states, Electrical conductivity Electrical properties Localization	es
dc.subject.other	CDU::6 - Ciencias aplicadas	es
dc.title	Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges	es
dc.type	info:eu-repo/semantics/article	es
dspace.entity.type	Publication	es